Effect of Cr sub-seed layer thickness on the...

Effect of Cr sub-seed layer thickness on the crystallographic orientation of Co-alloy recording media on glass

Qixu Chen,, Yen, E., Jianping Chen,, Ristau, R., Rajiv Ranjan,
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Volume:
35
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.800923
Date:
January, 1999
File:
PDF, 461 KB
english, 1999
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