[IEEE 2006 IEEE International Symposium on Circuits and Systems - Island of Kos, Greece (21-24 May 2006)] 2006 IEEE International Symposium on Circuits and Systems - A broadcast-based test scheme for reducing test size and application time
Jiann-Chyi Rau,, Jun-Yi Chang,, Chien-Shiun Chen,Year:
2006
Language:
english
DOI:
10.1109/iscas.2006.1692902
File:
PDF, 4.04 MB
english, 2006