[IEEE 2007 8th International Conference on Electronic Packaging Technology - Shanghai, China (2007.08.14-2007.08.17)] 2007 8th International Conference on Electronic Packaging Technology - Packaging Failure Isolation with Time-Domain Reflectometry (TDR) for Advanced BGA Packages
Yuan, Weiliang, Zhu, Wenhui, Win, Palei, Wang, C.K., Tan, H.B., Sun, Anthony Y.S.Year:
2007
Language:
english
DOI:
10.1109/icept.2007.4441499
File:
PDF, 2.26 MB
english, 2007