[IEEE IEEE Globecom 2006 - San Francisco, CA, USA (2006.11.27-2006.12.1)] IEEE Globecom 2006 - SAT02-5: Performance Analysis of MF-TDMA Multi-Carrier Demultiplexer/Demodulators (MCDs) in the Presence of Critical Degrading Factors
Kim, Junghwan, Li, Jinyan, Jo, Jin-ho, Lee, Seong-palYear:
2006
Language:
english
DOI:
10.1109/glocom.2006.480
File:
PDF, 283 KB
english, 2006