[IEEE 2011 21st International Conference on Noise and Fluctuations (ICNF) - Toronto, ON, Canada (2011.06.12-2011.06.16)] 2011 21st International Conference on Noise and Fluctuations - Defects influenced by the Jahn-Teller effect as the sources of flicker noise in GaAs based devices
Shmelev, Evgeny I., Klyuev, Alexey V., Yakimov, Arkady V.Year:
2011
Language:
english
DOI:
10.1109/icnf.2011.5994293
File:
PDF, 348 KB
english, 2011