[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Innovations in microwave measurement
Hayden, L., Henderson, R.Year:
2005
DOI:
10.1109/mwsym.2005.1517028
File:
PDF, 160 KB
2005