Ionizing dose hardness assurance methodology for qualification of a BiCMOS technology dedicated to high dose level applications
Flament, O., Musseau, O., Leray, J.L., Dutisseuil, E., Corbiere, T.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685217
Date:
June, 1998
File:
PDF, 570 KB
english, 1998