[IEEE SICE 2008 - 47th Annual Conference of the Society of Instrument and Control Engineers of Japan - Chofu (2008.08.20-2008.08.22)] 2008 SICE Annual Conference - Diffuse Optical Tomography maximizing localized variation in optical properties
Shinpei Okawa,, Yukio Yamada,Year:
2008
Language:
english
DOI:
10.1109/sice.2008.4654815
File:
PDF, 838 KB
english, 2008