[IEEE 2008 IEEE AUTOTESTCON - Salt Lake City, UT, USA (2008.09.8-2008.09.11)] 2008 IEEE AUTOTESTCON - Bringing focus to IVHM solution development
Bartz, Darrell, Reisig, ChristopherYear:
2008
Language:
english
DOI:
10.1109/autest.2008.4662682
File:
PDF, 404 KB
english, 2008