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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Novel Model for HCI Degradation and Impact of Conventional and Non-Conventional Scaling
Haggag, A., Kuffler, M., Zhang, D., Sadaka, M., Grudowski, P., Moosa, M.Year:
2006
Language:
english
DOI:
10.1109/relphy.2006.251350
File:
PDF, 311 KB
english, 2006