[IEEE 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (2011 NSS/MIC) - Valencia, Spain (2011.10.23-2011.10.29)] 2011 IEEE Nuclear Science Symposium Conference Record - Resistivity and mu-tau imager for automatic characterization of semiconductor materials
Sowinska, M., Simon, H., Raulo, A., Mycielski, A., Kochanowska, D., Witkowska-Baran, M., James, R. B.Year:
2011
Language:
english
DOI:
10.1109/nssmic.2011.6154723
File:
PDF, 1.06 MB
english, 2011