[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and...

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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - The proof of concept for 3-cm Altimetry using the Paris Interferometric Technique

Nogues-Correig, O., Ribo, S., Arco, J.C., Cardellach, E., Rius, A., Valencia, E., Tarongi, J.M., Camps, A., van der Marel, H., Martin-Neira, M.
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Year:
2010
Language:
english
DOI:
10.1109/igarss.2010.5650807
File:
PDF, 168 KB
english, 2010
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