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Escape of photoelectrons: a major energy resolution degrading mechanism in thin superconducting tunnel junction X-ray detectors
Van Vechten, D., Wood, K.S.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233443
Date:
March, 1993
File:
PDF, 701 KB
english, 1993