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Influence of Post Deposition Annealing Process on the Optical and Microwave Dielectric Properties of Bi 1.5 Zn 1.0 Nb 1.5 O 7 Thin Films
Sudheendran, K., Raju, K.C. JamesVolume:
119
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584587.2010.490703
Date:
November, 2010
File:
PDF, 497 KB
english, 2010