[IEEE 2010 20th International Conference on Pattern...

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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - An Illumination Quality Measure for Face Recognition

Rizo-Rodriguez, Dayron, Mendez-Vazquez, Heydi, Garcia-Reyes, Edel
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Year:
2010
Language:
english
DOI:
10.1109/icpr.2010.365
File:
PDF, 494 KB
english, 2010
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