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[IEEE 2010 18th Iranian Conference on Electrical Engineering (ICEE) - Isfahan, Iran (2010.05.11-2010.05.13)] 2010 18th Iranian Conference on Electrical Engineering - Modeling of Floating-Body effect on Negative Bias Temperature Instability degradation of double-gate MOSFETs
Ghobadi, Nayereh, Afzali-Kusha, Ali, Asl-Soleimani, EbrahimYear:
2010
Language:
english
DOI:
10.1109/iraniancee.2010.5507047
File:
PDF, 182 KB
english, 2010