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[IEEE 2008 American Control Conference (ACC '08) - Seattle, WA (2008.06.11-2008.06.13)] 2008 American Control Conference - Averaging sampling: Models and properties
Blachuta, Marian J., Grygiel, Rafal T.Year:
2008
Language:
english
DOI:
10.1109/acc.2008.4587044
File:
PDF, 309 KB
english, 2008