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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - New observations on the physical mechanism of Vth-variation in nanoscale CMOS devices after long term stress
Hsieh, E. R., Chung, Steve S., Tsai, C. H., Huang, R. M., Tsai, C. T., Liang, C. W.Year:
2011
Language:
english
DOI:
10.1109/irps.2011.5784610
File:
PDF, 399 KB
english, 2011