[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Combine hierarchical appearance statistics for accurate palmprint recognition
Yufei Han,, Zhenan Sun,, Tieniu Tan,Year:
2008
Language:
english
DOI:
10.1109/icpr.2008.4761859
File:
PDF, 250 KB
english, 2008