[IEEE 2011 IEEE/SICE International Symposium on System Integration (SII 2011) - Kyoto, Japan (2011.12.20-2011.12.22)] 2011 IEEE/SICE International Symposium on System Integration (SII) - Applying ANN to analyze the influence on the recovery of chrome after silicon and aluminums' melting of 15-5PH(V) in EAF
Wang, Jee-Ray, Hsueh, Pin-Yu, Zeng, Ping-You, Chu, Pin-HungYear:
2011
Language:
english
DOI:
10.1109/sii.2011.6147559
File:
PDF, 525 KB
english, 2011