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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Estimating rice growth parameters using X-band scatterometer data
Kim, YiHyun, Hong, SukYoung, Choe, Eunyoung, Lee, HoonyolYear:
2010
Language:
english
DOI:
10.1109/igarss.2010.5654066
File:
PDF, 213 KB
english, 2010