[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Measurement of handwriting skills for Japanese calligraphy
Sano, Tetsuya, Ukida, Hiroyuki, Yamamoto, HidekiYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488060
File:
PDF, 803 KB
english, 2010