An Effective Defect Inspection Method for LCD Using Active...

IEEE Transactions on Instrumentation and Measurement 2013 / 09 Vol. 62; Iss. 9

An Effective Defect Inspection Method for LCD Using Active Contour Model

Gan, Yangzhou, Zhao, Qunfei
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2013.2258242
Date:
September, 2013
File:
PDF, 511 KB
english, 2013
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