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[IEEE 2012 IEEE International Ultrasonics Symposium - Dresden, Germany (2012.10.7-2012.10.10)] 2012 IEEE International Ultrasonics Symposium - Relative film thickness and frequency dependency of mechanical stress in electrodes of SAW filters
Jewula, Tomasz, Zidek, Herbert P., Kovacs, Guenter, Bleyl, Ingo, Wagner, KarlYear:
2012
Language:
english
DOI:
10.1109/ultsym.2012.0310
File:
PDF, 361 KB
english, 2012