[IEEE 33rd Midwest Symposium on Circuits and Systems - Calgary, Alta., Canada (12-14 Aug. 1990)] Proceedings of the 33rd Midwest Symposium on Circuits and Systems - Detection of critical hazards in digital MOS VLSI circuits by switch-level timing simulation
Sass, D., Warmers, H., Horneber, E.-H.Year:
1991
Language:
english
DOI:
10.1109/mwscas.1990.140786
File:
PDF, 272 KB
english, 1991