Study of primary and secondary radiation defects formation...

Radiation Effects 1980 / 01 Vol. 46; Iss. 1-2

Study of primary and secondary radiation defects formation and annealing in p -type silicon

Mukashev, B. N., Kolodin, L. G., Nussupov, K. H., Spitsyn, A. V., Vavilov, V. S.
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Volume:
46
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578008209154
Date:
January, 1980
File:
PDF, 507 KB
english, 1980
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