[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Atomic scale characterization for nanoelectronic devices
Tung, Chih-hangYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306670
File:
PDF, 8.29 MB
english, 2006