Low-Temperature Annealing of Radiation-Induced Degradation...

IEEE Electron Device Letters 2010 / 07 Vol. 31; Iss. 7

Low-Temperature Annealing of Radiation-Induced Degradation in 4H-SiC Bipolar Junction Transistors

Hallén, Anders, Nawaz, Muhammad, Zaring, Carina, Usman, Muhammad, Domeij, Martin, Östling, Mikael
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2047237
Date:
July, 2010
File:
PDF, 268 KB
english, 2010
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