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[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Modeling the overshooting effect of multi-input gate in nanometer technologies
Ding, Li, Huang, Zhangcai, Jiang, Minglu, Kurokawa, Atsushi, Inoue, YasuakiYear:
2011
Language:
english
DOI:
10.1109/mwscas.2011.6026587
File:
PDF, 912 KB
english, 2011