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[IEEE 2009 International Student School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies (INTERNANO) - Novosibirsk, Russia (2009.10.28-2009.10.31)] 2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies - Thermal imaging microscopy: Application for diagnostics the microelectronic devices
Kuryshev, Georgy L.Year:
2009
DOI:
10.1109/internano.2009.5335612
File:
PDF, 2.91 MB
2009