Characterization of Thin-Film Decoupling and High-Frequency...

Japanese Journal of Applied Physics 2004 / 9 Vol. 43; Iss. 9B

Characterization of Thin-Film Decoupling and High-Frequency (Ba,Sr)TiO 3 Capacitors on Al 2 O 3 Ceramic Substrates

Koutsaroff, Ivoyl P., Bernacki, Thomas A., Zelner, Marina, Cervin-Lawry, Andrew, Jimbo, Takehito, Suu, Koukou
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Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.6740
Date:
September, 2004
File:
PDF, 135 KB
english, 2004
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