[IEEE 2008 NORCHIP - Tallin, Estonia...

  • Main
  • [IEEE 2008 NORCHIP - Tallin, Estonia...

[IEEE 2008 NORCHIP - Tallin, Estonia (2008.11.16-2008.11.17)] 2008 NORCHIP - Application of Sequential Test Set Compaction to LFSR Reseeding

Aleksejev, Igor, Jutman, Artur, Raik, Jaan, Ubar, Raimund
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/norchp.2008.4738292
File:
PDF, 131 KB
english, 2008
Conversion to is in progress
Conversion to is failed