[IEEE 2008 NORCHIP - Tallin, Estonia (2008.11.16-2008.11.17)] 2008 NORCHIP - Application of Sequential Test Set Compaction to LFSR Reseeding
Aleksejev, Igor, Jutman, Artur, Raik, Jaan, Ubar, RaimundYear:
2008
Language:
english
DOI:
10.1109/norchp.2008.4738292
File:
PDF, 131 KB
english, 2008