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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - Cryogenic to room temperature effects of NBTI in high-k PMOS devices
Southwick, Richard G., Purnell, Shem T., Rapp, Blake A., Thompson, Ryan J., Pugmire, Shane K., Kaczer, Ben, Grasser, Tibor, Knowlton, William B.Year:
2011
Language:
english
DOI:
10.1109/iirw.2011.6142577
File:
PDF, 519 KB
english, 2011