![](/img/cover-not-exists.png)
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Channel-substrate current and breakdown characteristics in GaAs MESFETs with varied MBE buffer thickness
Gao, F., Chanana, R., Nicholls, T.Year:
2001
Language:
english
DOI:
10.1109/gaasrw.2001.995737
File:
PDF, 3.31 MB
english, 2001