[IEEE 2011 IEEE Applied Power Electronics Colloquium (IAPEC) - Johor Bahru, Malaysia (2011.04.18-2011.04.19)] 2011 IEEE Applied Power Electronics Colloquium (IAPEC) - Automated test set-up for reverse recovery characterization of ultrafast diodes
Stahl, Juergen, Kuebrich, Daniel, Duerbaum, ThomasYear:
2011
Language:
english
DOI:
10.1109/iapec.2011.5779841
File:
PDF, 502 KB
english, 2011