[IEEE Exposition - Chicago, IL, USA (2008.04.21-2008.04.24)] 2008 IEEE/PES Transmission and Distribution Conference and Exposition - Synthetic test circuits for the operational tests of TCR and TSC Thyristor valves
Baoliang Sheng,, Oliveira, Marcio, Bjarme, Hans-OlaYear:
2008
Language:
english
DOI:
10.1109/tdc.2008.4517129
File:
PDF, 868 KB
english, 2008