[IEEE 2011 International Conference on Simulation of...

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[IEEE 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Osaka, Japan (2011.09.8-2011.09.10)] 2011 International Conference on Simulation of Semiconductor Processes and Devices - 3D TCAD simulation of advanced CMOS image sensors

Essa, Z., Boulenc, P., Tavernier, C., Hirigoyen, F., Crocherie, A., Michelot, J., Rideau, D., Essa, Z.
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Year:
2011
Language:
english
DOI:
10.1109/sispad.2011.6035082
File:
PDF, 6.54 MB
english, 2011
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