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[IEEE 2011 Future of Instrumentation International Workshop (FIIW) - Oak Ridge, TN, USA (2011.11.7-2011.11.8)] 2011 Future of Instrumentation International Workshop (FIIW) Proceedings - Data processing in multivariable RFID vapor sensors
Surman, Cheryl, Pietrzykowski, Matthew, Nagraj, Nandini, Morris, William, Sundaresan, Ashok, Tang, Zhexiong, Potyrailo, Radislav A.Year:
2011
Language:
english
DOI:
10.1109/fiiw.2011.6476811
File:
PDF, 665 KB
english, 2011