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[IEEE 2014 IEEE International Technology Management Conference (ITMC) - Chicago, IL, USA (2014.6.12-2014.6.15)] 2014 IEEE International Technology Management Conference - The impact of knowledge management system on the quality of test result in quality control and calibration laboratory
Hadian, Amir, Vaghasloo, Younes Alizadeh, Doroud, RezaYear:
2014
Language:
english
DOI:
10.1109/ITMC.2014.6918593
File:
PDF, 193 KB
english, 2014