[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - Algorithm of Scattered Data Repairing Based on Neural Networks
Du Libin,, Jichang, Sun, Guangli, Hou, Yan, LiuYear:
2007
Language:
english
DOI:
10.1109/icemi.2007.4350963
File:
PDF, 611 KB
english, 2007