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[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A 450ps Access-Time SRAM Macro in 45nm SOI Featuring a Two-Stage Sensing-Scheme and Dynamic Power Management

Pilo, Harold, Ramadurai, Vinod, Braceras, Geordie, Gabric, John, Lamphier, Steve, Tan, Yue
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Year:
2008
Language:
english
DOI:
10.1109/isscc.2008.4523215
File:
PDF, 808 KB
english, 2008
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