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[IEEE 2006 IEEE Odyssey - The Speaker and Language Recognition Workshop - San Juan, PR (2006.6.28-2006.6.28)] 2006 IEEE Odyssey - The Speaker and Language Recognition Workshop - Accurate Log-Likelihood Ratio Estimation by using Test Statistical Model for Speaker Verification
Matrouf, Driss, Bonastre, Jean-francoisYear:
2006
Language:
english
DOI:
10.1109/odyssey.2006.248139
File:
PDF, 456 KB
english, 2006