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[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Investigation of gate oxide thickness effect on the radiation-induced traps in MOSFET devices using OTCP method
Djezzar, Boualem, Oussalah, Slimane, Smatti, Abderrazak, Yefsah, Rabah, Mehlous, Mohamed, Mansouri, Belkacem, Mokrani, ArezkiYear:
2007
Language:
english
DOI:
10.1109/dtis.2007.4449524
File:
PDF, 388 KB
english, 2007