[IEEE 2000 50th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 2000)] 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) - Reliability characterization in Ultra CSP/sup TM/ package development
Yang, H., Elenius, P., Barrett, S., Schneider, C., Leal, J., Moraca, R., Moody, R., Young-Do Kweon,, Deok Hoon Kim,, Patterson, D., Goodman, T.Year:
2000
Language:
english
DOI:
10.1109/ectc.2000.853389
File:
PDF, 1.15 MB
english, 2000