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[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A 3.2Gb/s 8b Single-Ended Integrating DFE RX for 2-Drop DRAM Interface with Internal Reference Voltage and Digital Calibration
Chi, Hyung-Joon, Lee, Jae-Seung, Jeon, Seong-Hwan, Bae, Seung-Jun, Sim, Jae-Yoon, Park, Hong-JuneYear:
2008
Language:
english
DOI:
10.1109/isscc.2008.4523082
File:
PDF, 734 KB
english, 2008