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[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability
Dubois, Benoit, Kammerer, Jean-Baptiste, Hebrard, Luc, Braun, FrancisYear:
2007
Language:
english
DOI:
10.1109/isqed.2007.37
File:
PDF, 3.32 MB
english, 2007