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[IEEE IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Paris, France (2006.11.6-2006.11.10)] IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Dual Response Surface Approach for the Analysis of a Fuel Cell Durability Test
Wahdame, Bouchra, Candusso, Denis, Francois, Xavier, Harel, Fabien, Pera, Marie-Cecile, Hissel, Daniel, Kauffmann, Jean-MarieYear:
2006
Language:
english
DOI:
10.1109/iecon.2006.347692
File:
PDF, 357 KB
english, 2006