![](/img/cover-not-exists.png)
[IEEE 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Kansas, MO, USA (2006.10.15-2006.10.18)] 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Breakdown statistics of polyimide at low temperatures
Tuncer, Enis, Sauers, Isidor, James, D., Ellis, Alvin, Pace, MarshallYear:
2006
Language:
english
DOI:
10.1109/ceidp.2006.311994
File:
PDF, 3.89 MB
english, 2006