[IEEE 2007 International Semiconductor Device Research...

  • Main
  • [IEEE 2007 International Semiconductor...

[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Comparisons on performance improvement by nitride capping layer among different channel directions nMOSFETs

Tzu-I Tsai,, Yao-Jen Lee,, King-Sheng Chen,, Jeff Wang,, Fu-Kuo Hsueh,, Horng-Chih Lin,, Tiao-Yuan Huang,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422402
File:
PDF, 244 KB
english, 2007
Conversion to is in progress
Conversion to is failed