[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - Low threshold and low internal loss 1.55- mu m strained-layer single quantum well lasers
Zah, C.E., Bhat, R., Cheung, K.W., Andreadakis, N.C., Menocal, S.G., Wu, T.C., Favire, F.J., Xoza, M., Hwang, D.M., Lee, T.P.Year:
1990
Language:
english
DOI:
10.1109/iedm.1990.237210
File:
PDF, 216 KB
english, 1990